DWG.NO. DWG.NO.
MS5D3300 5/12
H04-004-03a
Fuji Electric Device Technology Co.,Ltd.
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Fu
i Electric Device Technolo
Co.,Ltd.
Test
No.
Test
items
Testing methods and conditions
Reference
standard
EIAJ ED4701
Sampling
number
Acceptance
number
1
High temp.
Storage
Temperature : stg max
Test duration : 1000h
EIAJ
ED4701/201
22
2
Low temp.
Storage
Temperature : stg min
Test duration : 1000h
EIAJ
ED4701/202
22
3
Temperature
humidity
storage
Temperature : 85±2°C
Relative humidit y : 85±5%
Test duration : 1000h
EIAJ
ED4701/103
test code C
22
4
Temperature
humidity
bias
Temperature : 85±2°C
Relative humidit y : 85±5%
Bias voltage : V
RRM
× 0.8
Test duration : 1000h
EIAJ
ED4701/103
test code C
22
5
Unsaturated
pressurized
vapor
Temperature : 130±2°C
Relative humidit y : 85±5%
Vapor pressure : 230kPa
Test duration : 48h
EIAJ
ED4701/103
test code F
22
6
Temperature
cycle
High temp. side : Tstg max
Room temp. : 5 35
Low temp. side : Tstg min
Duration time : HT 30min,RT 5min LT 30min
Number of cycles : 100 cycles
EIAJ
ED4701/105
22
7
Thermal
shock
Fluid : pure water(running water)
High temp. side : 100+0/-5°C
Low temp. side : 0+5/-0°C
Duration time : HT 5min,LT 5min
Number of cycles : 100 cycles
EIAJ
ED4701/307
test code A
22
8
Stead y state
operating
life
Ta=25±5°C
Rated load
Test duration : 1000h
22
9
Intermittent
operating
life
Tj=Tjmax 50
3min ON, 3min OFF
Test duration : 10000cycles
EIAJ
ED4701/106
22
Endurance test
10
High temp.
Reverse
bias
Temperature : Ta=100 °C
Bias voltage : VR=V
RRM
duty=1/2
Test duration : 1000h
EIAJ
ED4701/101
22
(0 : 1)
I
R
USL x 5 USL : Upper specification limit
Failure criteria
V
F
USL x 1.1