Approval sheet
Page 6 of 7 ASC_WR02X_J_AUTO_V01 May - 2014
TEST AND REQUIREMENTS (AEC Q-200 REV.D 2010)
REQUIREMENT
TEST PROCEDURE / TEST METHOD
Resistor
0Ω
ΩΩ
Ω
Electrical Characteristics
JISC5201-1: 1998
Clause 4.8
-
DC resistance values measurement
-
Temperature Coefficient of Resistance (T.C.R)
Natural resistance change per change in degree
centigrade.
( )
6
121
12
10×
−
ttR
RR
(ppm/°C) t
1
: 20°C+5°C-1°C
R
1
: Resistance at reference temperature (20°C+5°C/-
1°C)
R
2
: Resistance at test temperature (-55°C or +125°C)
Within the specified tolerance
Refer to “QUICK
REFERENCE DATA”
<50mΩ
Resistance to soldering
heat(R.S.H)
AEC Q200-15
Un-mounted chips completely immersed for 10±1second
in a SAC solder bath at 260℃±5ºC
ΔR/R max. ±(1%+0.05Ω)
no visible damage
<50mΩ
Solderability
AEC Q200-18
a. 4hrs @ 155’C, 235’C , 5 secs
b. 8hrs steam, 235’C, 5secs
95% coverage min., good tinning and no
visible damage
Temperature cycling
AEC Q200-4
30 minutes at -55°C±3°C, 2~3 minutes at 20°C+5°C-1°C,
30 minutes at +125°C±3°C, 2~3 minutes at 20°C+5°C-
1°C, total 1000 continuous cycles
∆R/R max. ±(1%+0.05Ω) < 50mΩ
Bias Humidity
AEC Q200-7
1000 +48/-0 hours, in humidity chamber controller at +85
℃/85%RH, 10% rated power
∆R/R max. ±(5%+0.10Ω)
< 50mΩ
Operational Life
MIL-STD-202 method
108
1000+48/-0 hours; 35% of operation power, 125±2°C ∆R/R max. ±(5%+0.10Ω)
< 50mΩ
High Temperature
Exposure
AEC Q200-3
1000 hrs @ 125℃, un-powered
∆R/R max. ±(5%+0.10Ω)
< 50mΩ
Bending strength
AEC Q200 -21
Resistors mounted on a 90mm glass epoxy resin
PCB(FR4), bending once 2mm for 60sec.
No visual damaged,
∆R/R max. ±(1%+0.05Ω)
< 50mΩ
Terminal strength
AEC Q200-22
Pressurizing force: 3N, Test time: 10±1sec.
No remarkable damage or removal of the
terminations
Vibration
AEC Q200-14
5 g's for 20 min , 12 cycles each of 3 orientations
△R/R max≦±(1%+0.05Ω)
and no visible damage
< 50mΩ
Mechanical Shock
AEC Q200-13
Shock machine, half sine,
100G, 6msec, XX'YY'ZZ', 10times each
△R/R max≦±(1%+0.05Ω)
and no visible damage
< 50mΩ
ESD (HBM)
AEC Q200-002
Human body model, 1.5 Kohm, 100 pF, 0.4KV
∆R/R max. ±(5%+0.10Ω)
< 50mΩ
