4
White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520
WF512K32-XXX5
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS,CS CONTROLLED
(V
CC = 5.0V, VSS = 0V, TA = -55°C to +125°C)
FIG. 4
AC TEST CIRCUIT
AC TEST CONDITIONS
NOTES:
V
Z is programmable from -2V to +7V.
I
OL & IOH programmable from 0 to 16mA.
Tester Impedance Z
0 = 75 Ω.
V
Z is typically the midpoint of VOH and VOL.
I
OL & IOH
are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
Parameter Typ Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall 5 ns
Input and Output Reference Level 1.5 V
Output Timing Reference Level 1.5 V
I
Current Source
D.U.T.
C = 50 pf
eff
I
OL
V
≈
1.5V
(Bipolar Supply)
Z
Current Source
OH
Parameter Symbol -60 -70 -90 -120 -150 Unit
Min Max Min Max Min Max Min Max Min Max
Write Cycle Time tAVAV tWC 60 70 90 120 150 ns
Write Enable Setup Time tWLEL tWS 00000ns
Chip Select Pulse Width tELEH tCP 40 45 45 50 50 ns
Address Setup Time tAVEL tAS 00000ns
Data Setup Time tDVEH tDS 40 45 45 50 50 ns
Data Hold Time tEHDX tDH 00000ns
Address Hold Time tELAX tAH 40 45 45 50 50 ns
Chip Select Pulse Width High tEHEL tCPH 20 20 20 20 20 ns
Duration of Byte Programming Operation (1) tWHWH1 300 300 300 300 300 µs
Sector Erase Time (2) tWHWH2 15 15 15 15 15 sec
Read Recovery Time tGHEL 00000ns
Chip Programming Time 11 11 11 11 11 sec
Chip Erase Time (3) 64 64 64 64 64 sec
NOTES:
1. Typical value for t
WHWH1 is 7µs.
2. Typical value for t
WHWH2 is 1sec.
3. Typical value for Chip Erase Time is 8sec.