SKP06N60, SKB06N60
SKA06N60
9Jul-02
t
rr
, REVE RSE RECOVERY TIM E
50A/µs 150A/µs250A/µs350A/µs 450A/µs 550A/µs
0ns
100ns
200ns
300ns
400ns
500ns
I
F
= 3A
I
F
= 6A
I
F
= 12A
Q
rr
, REVE RSE RE COV ERY CHARGE
50A/µs150A/µs 250A/µs 350A/µs 450A/µs 550A/µs
0nC
200nC
400nC
600nC
800nC
1000nC
I
F
= 3A
I
F
= 6A
I
F
= 12A
di
F
/dt, DIODE CURRENT S L OPE di
F
/dt, DIODE CURRENT S L OPE
Figure 20. Typical reverse recovery time as
a function of diode current slope
(V
R
= 200V, T
j
= 125°C,
Dynamic test circuit in Figure E)
Figure 21. Typical reverse recovery charge
as a function of diode current slope
(V
R
= 200V, T
j
= 125°C,
Dynamic test circuit in Figure E)
I
rr
, REVE RSE RECOVERY CURRENT
50A/µs 150A/µs 250A/µs 350A/µs 450A/µs 550A/µs
0A
2A
4A
6A
8A
10A
12A
I
F
= 3A
I
F
= 12A
I
F
= 6A
di
rr
/dt, DIO DE PEAK RATE OF FALL
OF REVERSE RE COVERY CURRENT
50A/µs 150A/µs 250A/µs 350A/µs 450A/µs 550A/µs
0A/
µs
100A/
µs
200A/
µs
300A/
µs
400A/
µs
500A/
µs
600A/
µs
di
F
/dt, DIODE CURRENT SLOPE di
F
/dt, DIODE CURRENT SLOPE
Figure 22. Typical reverse recovery current
as a function of diode current slope
(V
R
= 200V, T
j
= 125°C,
Dynamic test circuit in Figure E)
Figure 23. Typical diode peak rate of fall of
reverse recovery current as a function of
diode current slope
(V
R
= 200V, T
j
= 125°C,
Dynamic test circuit in Figure E)
