-5-
SEOUL SEMICONDUCTOR CO., LTD.
148-29, Kasan-Dong, Keumchun-Gu, Seoul, Korea
TEL : 82-2-3281-6269 FAX : 82-2-857-5430
<060712> Rev. 0.1
LR770D
5. RELIABILITY TESTS
0/221 time1kV, 1.5kΩ ; 100pF
ESD
(Human Body Model)
0/50100cycles
T
a
= -50ºC (30min) ~ 105º (30min)
(Transfer time : 5sec, 1Cycle = 1hr)
Thermal Shock
0/22100hrs
T
a
= 85ºC, RH = 85%
I
F
= 15mA
Temperature Humidity
Operating
0/221000hrsT
a
= 85ºC, RH = 85%
Temperature Humidity
Storage
0/221000hrsT
a
= -50ºC
Low Temperature
Storage
0/221000hrsT
a
= 105ºC
High Temperature
Storage
0/22
0/22
0/22
0/22
Failures
1 timeT
s
= 255 ± 5ºC, t = 10sec
Resistance to soldering
Heat
1000hrsT
a
= 85ºC, I
F
= 15mA
High Temperature
Operating
1000hrsT
a
= -30ºC, I
F
= 20mA
Low Temperature
Operating
1000hrsT
a
= RT, I
F
= 30mALife Test
NoteConditionItem
< Judging Criteria For Reliability Tests >
LSL
2
X 0.7I
V
USL X 2.0I
R
USL
1
X 1.2V
F
Notes : 1. USL : Upper Standard Level 2. LSL : Lower Standard Level.
