LMH6624
,
LMH6626
www.ti.com
SNOSA42G –NOVEMBER 2002–REVISED DECEMBER 2014
6.5 Electrical Characteristics ±2.5 V
Unless otherwise specified, all limits ensured at T
A
= 25°C, V
+
= 2.5 V, V
−
= −2.5 V, V
CM
= 0 V, A
V
= +20, R
F
= 500 Ω,
R
L
= 100 Ω. See
(1)
.
PARAMETER TEST CONDITIONS MIN
(2)
TYP
(3)
MAX
(2)
UNIT
DYNAMIC PERFORMANCE
V
O
= 400 mV
PP
(LMH6624) 90
f
CL
−3dB BW MHz
V
O
= 400 mV
PP
(LMH6626) 80
V
O
= 2 V
PP
, A
V
= +20 (LMH6624) 300
V
O
= 2 V
PP
, A
V
= +20 (LMH6626) 290
SR Slew rate
(4)
V/μs
V
O
= 2 V
PP
, A
V
= +10 (LMH6624) 360
V
O
= 2 V
PP
, A
V
= +10 (LMH6626) 340
t
r
Rise time V
O
= 400 mV Step, 10% to 90% 4.1 ns
t
f
Fall time V
O
= 400 mV Step, 10% to 90% 4.1 ns
t
s
Settling time 0.1% V
O
= 2 V
PP
(Step) 20 ns
DISTORTION and NOISE RESPONSE
f = 1 MHz (LMH6624) 0.92
e
n
Input referred voltage noise nV/√Hz
f = 1 MHz (LMH6626) 1.0
f = 1 MHz (LMH6624) 2.3
i
n
Input referred current noise pA/√Hz
f = 1 MHz (LMH6626) 1.8
HD2 2
nd
harmonic distortion f
C
= 10 MHz, V
O
= 1 V
PP
, R
L
100 Ω −60 dBc
HD3 3
rd
harmonic distortion f
C
= 10 MHz, V
O
= 1 V
PP
, R
L
100 Ω −76 dBc
INPUT CHARACTERISTICS
−0.75 −0.25 +0.75
Input offset voltage V
CM
= 0 V mV
V
OS
-40°C ≤ T
J
≤ 125°C −0.95 +0.95
Average drift
(5)
V
CM
= 0 V ±0.25 μV/°C
−1.5 −0.05 +1.5
Input offset current V
CM
= 0 V μA
I
OS
-40°C ≤ T
J
≤ 125°C −2.0 +2.0
Average drift
(5)
V
CM
= 0 V 2 nA/°C
13 +20
Input bias current V
CM
= 0 V μA
I
B
-40°C ≤ T
J
≤ 125°C +25
Average drift
(5)
V
CM
= 0 V 12 nA/°C
Common Mode 6.6 MΩ
R
IN
Input resistance
(6)
Differential Mode 4.6 kΩ
Common Mode 0.9
C
IN
Input capacitance
(6)
pF
Differential Mode 2.0
Input Referred, V
CM
= −0.5 to +1.9 V 87 90
Common mode rejection
CMRR dB
Input Referred,
ratio
-40°C ≤ T
J
≤ 125°C 85
V
CM
= −0.5 to +1.75 V
(1) Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that T
J
= T
A
. No ensured specification of parametric performance is indicated in the electrical
tables under conditions of internal self-heating where T
J
> T
A
. Absolute maximum ratings indicate junction temperature limits beyond
which the device may be permanently degraded, either mechanically or electrically.
(2) All limits are specified by testing or statistical analysis.
(3) Typical Values represent the most likely parametric norm.
(4) Slew rate is the slowest of the rising and falling slew rates.
(5) Average drift is determined by dividing the change in parameter at temperature extremes into the total temperature change.
(6) Simulation results.
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