While the INTEST instruction is present in the Instruction Register, the Boundary Scan Data Register
can be accessed to sample and shift out the current data and load new data into the Boundary Scan
Data Register.
4.5.1.3 SAMPLE/PRELOAD Instruction
The SAMPLE/PRELOAD instruction connects the Boundary Scan Data Register chain between
TDI and TDO. This instruction samples the current state of the pad pins for observation and preloads
new test data. Each GPIO pad has an associated input, output, and output enable signal. When the
TAP controller enters the Capture DR state during this instruction, the input, output, and output-enable
signals to each of the GPIO pads are captured. These samples are serially shifted out on TDO while
the TAP controller is in the Shift DR state and can be used for observation or comparison in various
tests.
While these samples of the inputs, outputs, and output enables are being shifted out of the Boundary
Scan Data Register, new data is being shifted into the Boundary Scan Data Register from TDI.
Once the new data has been shifted into the Boundary Scan Data Register, the data is saved in the
parallel load registers when the TAP controller enters the Update DR state. This update of the
parallel load register preloads data into the Boundary Scan Data Register that is associated with
each input, output, and output enable. This preloaded data can be used with the EXTEST and
INTEST instructions to drive data into or out of the controller. See “Boundary Scan Data
Register” on page 173 for more information.
4.5.1.4 ABORT Instruction
The ABORT instruction connects the associated ABORT Data Register chain between TDI and
TDO. This instruction provides read and write access to the ABORT Register of the ARM Debug
Access Port (DAP). Shifting the proper data into this Data Register clears various error bits or initiates
a DAP abort of a previous request. See the “ABORT Data Register” on page 174 for more information.
4.5.1.5 DPACC Instruction
The DPACC instruction connects the associated DPACC Data Register chain between TDI and
TDO. This instruction provides read and write access to the DPACC Register of the ARM Debug
Access Port (DAP). Shifting the proper data into this register and reading the data output from this
register allows read and write access to the ARM debug and status registers. See “DPACC Data
Register” on page 174 for more information.
4.5.1.6 APACC Instruction
The APACC instruction connects the associated APACC Data Register chain between TDI and
TDO. This instruction provides read and write access to the APACC Register of the ARM Debug
Access Port (DAP). Shifting the proper data into this register and reading the data output from this
register allows read and write access to internal components and buses through the Debug Port.
See “APACC Data Register” on page 174 for more information.
4.5.1.7 IDCODE Instruction
The IDCODE instruction connects the associated IDCODE Data Register chain between TDI and
TDO. This instruction provides information on the manufacturer, part number, and version of the
ARM core. This information can be used by testing equipment and debuggers to automatically
configure input and output data streams. IDCODE is the default instruction loaded into the JTAG
Instruction Register when a Power-On-Reset (POR) is asserted, or the Test-Logic-Reset state is
entered. See “IDCODE Data Register” on page 173 for more information.
July 24, 2012172
Texas Instruments-Production Data
JTAG Interface
OBSOLETE: TI has discontinued production of this device.
