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AT28C256E-15TI

AT28C256E-15TI首页预览图
型号: AT28C256E-15TI
PDF文件:
  • AT28C256E-15TI PDF文件
  • AT28C256E-15TI PDF在线浏览
功能描述: 256K 32K x 8 Paged CMOS E2PROM
PDF文件大小: 762.46 Kbytes
PDF页数: 共14页
制造商: ATMEL[ATMEL Corporation]
制造商LOGO: ATMEL[ATMEL Corporation] LOGO
制造商网址: http://www.atmel.com
捡单宝AT28C256E-15TI
PDF页面索引
120%
Block Diagram
The AT28C256 is accessed like a Static RAM for the read
or write cycle without the need for external components.
The device contains a 64-byte page register to allow writ-
ing of up to 64-bytes simultaneously. During a write cycle,
the addresses and 1 to 64-bytes of data are internally
latched, freeing the address and data bus for other opera-
tions. Following the initiation of a write cycle, the device
will automatically write the latched data using an internal
control timer. The end of a write cycle can be detected by
DATA POLLING of I/O7. Once the end of a write cycle has
been detected a new access for a read or write can begin.
Atmel’s 28C256 has additional features to ensure high
quality and manufacturability. The device utilizes internal
error correction for extended endurance and improved
data retention characteristics. An optional software data
protection mechanism is available to guard against inad-
vertent writes. The device also inc ludes an ex tra 64- bytes
of E
2
PROM for device identification or tracking.
Description (Continued)
Temperature Under Bias................. -55°C to +125°C
Storage Temperature...................... -65°C to +150°C
All Input Voltages
(including NC Pins)
with Respect to Ground ................... -0.6V to +6.25V
All Output Voltages
with Respect to Ground .............-0.6V to V
CC
+ 0.6V
Voltage on OE and A9
with Respect to Ground ................... -0.6V to +13.5V
*NOTICE: Stresse s beyond those liste d unde r “Absolu te Maxi-
mum Ratin gs” may cau se perman en t da ma ge to th e de vi ce.
This is a stress rating only and functional operation of the
device at these or any other conditions beyond those indi-
cated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions
for extended periods may affect device reliability.
Absolute Maximum Ratings*
2-218 AT28C256
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