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AS8FLC2M32BQ-90/IT

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型号: AS8FLC2M32BQ-90/IT
PDF文件:
  • AS8FLC2M32BQ-90/IT PDF文件
  • AS8FLC2M32BQ-90/IT PDF在线浏览
功能描述: Hermetic, Multi-Chip Module (MCM) 64Mb, 2M x 32, 3.3Volt Boot Block FLASH Array
PDF文件大小: 415.79 Kbytes
PDF页数: 共29页
制造商: AUSTIN[Austin Semiconductor]
制造商LOGO: AUSTIN[Austin Semiconductor] LOGO
制造商网址: http://www.austinsemiconductor.com
捡单宝AS8FLC2M32BQ-90/IT
PDF页面索引
120%
AUSTIN SEMICONDUCTOR, INC.
FLASHFLASH
FLASHFLASH
FLASH
AS8FLC2M32
AS8FLC2M32B
Rev. 1.2 5/09
Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.
16
Austin Semiconductor, Inc.
Pin Description/Assignment Table
Signal Name Symbol Type Pin DEF/Package=QT Symbol Pin DEF/Package=H Description
Address A0, A1, A2. A3, Input 8, 7, 6, 5, A0, A1, A2. A3, 7, 60, 61, 62, 49, 50, Address Inputs
A4, A5, A6, A7 4, 3, 66, 65, A4, A5, A6, A7 51, 37, 41, 17, 16, 6,
A8, A9, A10, A11 64, 63, 62, 28, A8, A9, A10, A11 38, 40, 4, 18, 5, 28,
A12,A13,A14,A15 29,30,31,32, A12,A13,A14,A15 8, 21
A16,A17,A18,A19 33,37,41,42 A16,A17,A18,A19
Chip Selects CS1\, CS2
\
Input 34, 36, CS1\, CS2
\
20, 13, 53, 46 Active Low True Chip Selects (Enables)
CS3\, CS4\ 2, 68 CS3\, CS4\
Write Enables
WE1\, WE2
\
Input
67, 38, WE
\
29
Active Low True Write Enable(s)
WE3\, WE4
\
39, 40
Output Enable
OE
\
Input
35 OE
\
27
Active Low True Output Enable (x32)
Reset
RESET
\
Input
9 RESET
\
12
Active Low True Reset
Power Supply VCC Input 61,27 VCC 19, 45 Power for Core and I/O
Ground [Core]
VSS
Input
1,52,18 VSS 14, 54
Digital GND
Data Input, Output I/O0,I/O1,I/O2 Input/ 10,11,12,13,14,15, I/O0,I/O1,I/O2 9, 10, 11, 22, 33, 32, Data Input, Output
I/O3,I/O4,I/O5
Output
16,17,19,20,21,22, I/O3,I/O4,I/O5 31, 30, 1, 2, 3, 15
I/O6,I/O7,1/O8 23,24,25,26,60,59, I/O6,I/O7,1/O8 26, 25, 24, 23, 42, 43
I/O9,I/O10,I/O11 58,57,56,55,54,53, I/O9,I/O10,I/O11 44, 55, 66, 65, 65, 63
I/O12,I/O13,I/O14 51,50,49,48,47,46, I/O12,I/O13,I/O14 34, 35, 36, 42, 43, 44,
I/O15,I/O16,I/O17 45,44 I/O15,I/O16,I/O17 55, 66, 65, 64, 63,
I/O18,I/O19,I/O20 I/O18,I/O19,I/O20 34, 35, 48, 59, 58,
I/O21,I/O22,I/O23 I/O21,I/O22,I/O23 57, 56
I/O24,I/O25,I/O26 I/O24,I/O25,I/O26
I/O27,I/O28,I/O29 I/O27,I/O28,I/O29
I/O30,I/O31 I/O30,I/O31
No Connection NC OPEN 43 NC 47, 52, 39 No internal connection
Absolute Maximum Ratings*
Absolute Maximum Ratings
Parameter Symbol Min. Max. Units
Voltage on VDD Pin (Note 1)
VCC
-0.5 4 V
Voltage on A9, OE\,
-0.5 12.5 V
and RESET\ (Note 2)
Voltage on Input Pins
VIN
-0.5 VCC+0.5 V
Voltage on I/O Pins
VIO
-0.5 VDDQ+0.5 V
Output Short Circuit Current
ISC
200 mA
(Note 3)
Storage Temperature
tSTG
-65 150
ο
C
Operating Temperatures
IT
-40 85
ο
C
[Screenin
g
Levels]
/
XT
-55 125
ο
C
VCNTL
1. Minimum DC voltage on any Input or Input/Output pin is
–0.5v. During voltage transitions, input or input/output
pins may undershoot VSS to –2.0v for periods of up to
20ns.
2. Minimum DC input/output voltage on pins A9, OE\, and
RESET\ is-0.5v. During voltage transitions, A9, OE\, and
RESET\ may undershoot VSS to –2.0v for periods of up to
20ns. Maximum DC input voltage on pin A9 is +12.5v
which may overshoot to 14.0v for periods up to 20ns.
3. No more than one output may be shorted to ground at a
time. Duration of the short circuit should not be greater
than one (1) second.
*Stress greater than those listed under ABSOLUTE
MAXIMUM RATINGS may cause permanent damage to
the device. This is a stress rating only and functional
operation of the device at these or any other conditions
greater than those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum conditions for any duration or segment of time
may affect device reliability.
Test Conditions
Test Specifications
Parameter -70/-90 -100/-120 Units
Output Load 1 TTL Gate
Output Load Capacitance,
CL (including Jig)
Input Rise and Fall Times
5ns
Input Pulse Levels
0.0-3.0 V
Input timing measurement
reference levels
Output timing measurement
reference levels
1.5
V
V
30 100
pF
1.5
Test Set-Up
Device
Under
Test
3.3v
CL
6.2K
ohm
1N3064
1N3064
1N3064
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