IGLOO nano DC and Switching Characteristics
2-42 Revision 17
Table 2-70 • Parameter Definition and Measuring Nodes
Parameter Name Parameter Definition
Measuring Nodes
(from, to)*
t
OCLKQ
Clock-to-Q of the Output Data Register H, DOUT
t
OSUD
Data Setup Time for the Output Data Register F, H
t
OHD
Data Hold Time for the Output Data Register F, H
t
OPRE2Q
Asynchronous Preset-to-Q of the Output Data Register L, DOUT
t
OREMPRE
Asynchronous Preset Removal Time for the Output Data Register L, H
t
ORECPRE
Asynchronous Preset Recovery Time for the Output Data Register L, H
t
OECLKQ
Clock-to-Q of the Output Enable Register H, EOUT
t
OESUD
Data Setup Time for the Output Enable Register J, H
t
OEHD
Data Hold Time for the Output Enable Register J, H
t
OEPRE2Q
Asynchronous Preset-to-Q of the Output Enable Register I, EOUT
t
OEREMPRE
Asynchronous Preset Removal Time for the Output Enable Register I, H
t
OERECPRE
Asynchronous Preset Recovery Time for the Output Enable Register I, H
t
ICLKQ
Clock-to-Q of the Input Data Register A, E
t
ISUD
Data Setup Time for the Input Data Register C, A
t
IHD
Data Hold Time for the Input Data Register C, A
t
IPRE2Q
Asynchronous Preset-to-Q of the Input Data Register D, E
t
IREMPRE
Asynchronous Preset Removal Time for the Input Data Register D, A
t
IRECPRE
Asynchronous Preset Recovery Time for the Input Data Register D, A
Note: *See Figure 2-12 on page 2-41 for more information.
