Device Architecture
2-178 Revision 4
Single-Ended I/O Characteristics
3.3 V LVTTL / 3.3 V LVCMOS
Low-Voltage Transistor–Transistor Logic is a general-purpose standard (EIA/JESD) for 3.3 V
applications. It uses an LVTTL input buffer and push-pull output buffer. The 3.3 V LVCMOS standard is
supported as part of the 3.3 V LVTTL support.
Table 2-102 • Minimum and Maximum DC Input and Output Levels
3.3 V LVTTL /
3.3 V LVCMOS VIL VIH VOL VOH IOL IOH IOSL IOSH IIL
1
IIH
2
Drive Strength
Min.
V
Max.
V
Min.
V
Max.
V
Max.
V
Min.
VmAmA
Max.
mA
3
Max.
mA
3
µA
4
µA
4
Applicable to Pro I/O Banks
4 mA –0.3 0.8 2 3.6 0.4 2.4 4 4 27 25 10 10
8 mA –0.3 0.8 2 3.6 0.4 2.4 8 8 54 51 10 10
12 mA –0.3 0.8 2 3.6 0.4 2.4 12 12 109 103 10 10
16 mA –0.3 0.8 2 3.6 0.4 2.4 16 16 127 132 10 10
24 mA –0.3 0.8 2 3.6 0.4 2.4 24 24 181 268 10 10
Applicable to Advanced I/O Banks
2 mA –0.3 0.8 2 3.6 0.4 2.4 2 2 27 25 10 10
4 mA –0.3 0.8 2 3.6 0.4 2.4 4 4 27 25 10 10
6 mA –0.3 0.8 2 3.6 0.4 2.4 6 6 54 51 10 10
8 mA –0.3 0.8 2 3.6 0.4 2.4 8 8 54 51 10 10
12 mA –0.3 0.8 2 3.6 0.4 2.4 12 12 109 103 10 10
16 mA –0.3 0.8 2 3.6 0.4 2.4 16 16 127 132 10 10
24 mA –0.3 0.8 2 3.6 0.4 2.4 24 24 181 268 10 10
Applicable to Standard I/O Banks
2 mA –0.3 0.8 2 3.6 0.4 2.4 2 2 27 25 10 10
4 mA –0.3 0.8 2 3.6 0.4 2.4 4 4 27 25 10 10
6 mA –0.3 0.8 2 3.6 0.4 2.4 6 6 54 51 10 10
8 mA –0.3 0.8 2 3.6 0.4 2.4 8 8 54 51 10 10
Notes:
1. IIL is the input leakage current per I/O pin over recommended operation conditions where –0.3 V < VIN < VIL.
2. IIH is the input leakage current per I/O pin over recommended operating conditions VIH < VIN < VCCI. Input current is
larger when operating outside recommended ranges.
3. Currents are measured at high temperature (100°C junction temperature) and maximum voltage.
4. Currents are measured at 85°C junction temperature.
5. Software default selection highlighted in gray.
Figure 2-119 • AC Loading
Table 2-103 • AC Waveforms, Measuring Points, and Capacitive Loads
Input Low (V) Input High (V) Measuring Point* (V) VREF (typ.) (V) C
LOAD
(pF)
03.31.4–35
Note: *Measuring point = Vtrip. See Table 2-90 on page 2-169 for a complete table of trip points.
Test Point
Test Point
Enable Path
Data Path
35 pF
R = 1 k
R to VCCI for t
LZ
/ t
ZL
/ t
ZLS
R to GND for t
HZ
/ t
ZH
/ t
ZHS
35 pF for t
ZH
/ t
ZHS
/ t
ZL
/ t
ZLS
35 pF for t
HZ
/ t
LZ