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A40MX02-BGG208

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型号: A40MX02-BGG208
PDF文件:
  • A40MX02-BGG208 PDF文件
  • A40MX02-BGG208 PDF在线浏览
功能描述: 40MX and 42MX FPGA Families
PDF文件大小: 7439.21 Kbytes
PDF页数: 共142页
制造商: MICROSEMI[Microsemi Corporation]
制造商LOGO: MICROSEMI[Microsemi Corporation] LOGO
制造商网址: http://www.microsemi.com
捡单宝A40MX02-BGG208
PDF页面索引
120%
40MX and 42MX FPGA Families
1-14 Revision 11
parallel ports are connected to the internal core lo gic tile an d the input, output and control po rts of an I/O
buffer to capture and load data into the register to control or observe the logic state of each I/O.
Figure 1-13 • 42MX IEEE 1149.1 Boundary Scan Circuitry
Table 1-3 • Test Access Port Descriptions
Port Description
TMS
(Test Mode Select)
Serial input for the test logic control bits. Data is captured on the rising edge of the test logic
clock (TCK).
TCK
(Test Clock Input)
Dedicated test logic clock used serially to shift test instruction, test data, and control inputs
on the rising edge of the clock, a nd serially to shift the ou tput data on the fa lling e dge of the
clock. The maximum clock frequency for TCK is 20 MHz.
TDI
(Test Data Input)
Serial input for instruction an d te st data. Data is captured on the risi ng edge of the test logic
clock.
TDO
(Test Data Output)
Serial output for test instruction and data from the te st logic. TD O is set to an Inactive Drive
state (high impedance) when data scanning is not in progress.
Table 1-4 • Supported BST Public Instructions
Instruction
IR Code
(IR2.IR0)
Instruction
Type Description
EXTEST 000 Mandatory Allows the external circuitry and board-level interconnections to be
tested by forcing a test pattern at the output pins and capturing test
results at the input pins.
SAMPLE/PRELOAD 001 Mandatory Allows a snapshot of the signals at the device pins to be captured
and examined during operation
HIGH Z 101 Optional Trist ates all I/Os to allow external signals to drive pins. Please refer to
the IEEE Standard 1149.1 specification.
CLAMP 110 Optional Allows state of signals driven from component pins to be determined
from the Boundary-Scan Registe r. Ple ase refer to the IEEE Standard
1149.1 specification for details.
BYPASS 111 Mandatory Enables the bypass register between the TDI and TDO pins. The test
data passes through the selected device to adjacent devices in the
test chain.
Boundary Scan Register
Instruction
Decode
Control Logic
TAP Controller
Instruction
Register
Bypass
Register
TMS
TCK
TDI
Output
MUX
TDO
JTAG
JTAG
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