SmartFusion DC and Switching Characteristics
2-76 Revision 10
Embedded FlashROM (eFROM)
Electrical Characteristics
Table 2-91 describes the eFROM maximum performance
JTAG 1532 Characteristics
JTAG timing delays do not include JTAG I/Os. To obtain complete JTAG timing, add I/O buffer delays to
the corresponding standard selected; refer to the I/O timing characteristics in the "User I/O
Characteristics" section on page 2-19 for more details.
Timing Characteristics
Table 2-91 • FlashROM Access Time, Worse Commercial Case Conditions: T
J
= 85°C, VCC = 1.425 V
Parameter Description –1 Std. Units
t
CK2Q
Clock to out per configuration* 28.68 32.98 ns
F
max
Maximum Clock frequency 15.00 15.00 MHz
Table 2-92 • JTAG 1532
Worst Commercial-Case Conditions: T
J
= 85°C, Worst-Case VCC = 1.425 V
Parameter Description –1 Std. Units
t
DISU
Test Data Input Setup Time 0.67 0.77 ns
t
DIHD
Test Data Input Hold Time 1.33 1.53 ns
t
TMSSU
Test Mode Select Setup Time 0.67 0.77 ns
t
TMDHD
Test Mode Select Hold Time 1.33 1.53 ns
t
TCK2Q
Clock to Q (data out) 8.00 9.20 ns
t
RSTB2Q
Reset to Q (data out) 26.67 30.67 ns
F
TCKMAX
TCK Maximum Frequency 19.00 21.85 MHz
t
TRSTREM
ResetB Removal Time 0.00 0.00 ns
t
TRSTREC
ResetB Recovery Time 0.27 0.31 ns
t
TRSTMPW
ResetB Minimum Pulse TBD TBD ns
Note: For specific junction temperature and voltage supply levels, refer to Table 2-7 on page 2-9 for derating values.