2003 Microchip Technology Inc. DS21795B-page 3
93AA66A/B/C, 93LC66A/B/C, 93C66A/B/C
TABLE 1-2: AC CHARACTERISTICS
All parameters apply over the specified
ranges unless otherwise noted.
V
CC = range by device (see Table on Page 1)
Industrial (I): T
A = -40°C to +85°C
Automotive (E): T
A = -40°C to +125°C
Param.
No.
Symbol Parameter Min Max Units Conditions
A1 FCLK Clock frequency — 3
2
1
MHz
MHz
MHz
4.5V ≤ VCC < 5.5V, 93XX66C only
2.5V ≤ V
CC < 5.5V
1.8V ≤ V
CC < 2.5V
A2 TCKH Clock high time 200
250
450
—ns
ns
ns
4.5V ≤ VCC < 5.5V, 93XX66C only
2.5V ≤ V
CC < 5.5V
1.8V ≤ V
CC < 2.5V
A3 TCKL Clock low time 100
200
450
—ns
ns
ns
4.5V ≤ VCC < 5.5V, 93XX66C only
2.5V ≤ V
CC < 5.5V
1.8V ≤ V
CC < 2.5V
A4 TCSS Chip Sele ct set up tim e 50
100
250
—ns
ns
ns
4.5V ≤ VCC < 5.5V
2.5V ≤ V
CC < 4.5V
1.8V ≤ V
CC < 2.5V
A5 TCSH Chip Sele ct hol d time 0 — ns 1.8V ≤ VCC < 5.5V
A6 T
CSL Chip Sele ct low tim e 250 — ns 1.8V ≤ VCC < 5.5V
A7 TDIS Data input setup time 50
100
250
—ns
ns
ns
4.5V ≤ VCC < 5.5V, 93XX66C only
2.5V ≤ V
CC < 5.5V
1.8V ≤ V
CC < 2.5V
A8 TDIH Data input hold time 50
100
250
—ns
ns
ns
4.5V ≤ VCC < 5.5V, 93XX66C only
2.5V ≤ V
CC < 5.5V
1.8V ≤ V
CC < 2.5V
A9 TPD Data output delay time — 200
250
400
ns
ns
ns
4.5V ≤ VCC < 5.5V, CL = 100 pF
2.5V ≤ V
CC < 4.5V, CL = 100 pF
1.8V ≤ V
CC < 2.5V, CL = 100 pF
A10 TCZ Data output disable time — 100
200
ns
ns
4.5V ≤ VCC < 5.5V, (Note 1)
1.8V ≤ V
CC < 4.5V, (Note 1)
A11 T
SV Status valid time — 200
300
500
ns
ns
ns
4.5V ≤ V
CC < 5.5V, CL = 100 pF
2.5V ≤ V
CC < 4.5V, CL = 100 pF
1.8V ≤ V
CC < 2.5V, CL = 100 pF
A12 T
WC Progra m cyc le time — 6 ms Erase/W ri te m ode (AA and LC ve r-
sions)
A13 T
WC — 2 ms Erase/Write mode
(93C versions)
A14 T
EC — 6 ms ERAL mode, 4.5V ≤ VCC ≤ 5.5V
A15 TWL — 15 ms WRAL mode, 4.5V ≤ VCC ≤ 5.5V
A16 — Endurance 1M — cycles 25°C, V
CC = 5.0V, (Note 2)
Note 1: This parameter is periodically sampled and not 100% tested.
2: This application is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which may be obtained from
www.microchip.com.
