20
X7R Dielectric
Specications and Test Methods
Parameter/Test X7R Specication Limits Measuring Conditions
Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber
Capacitance Within specied tolerance
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
For Cap > 10µF, 0.5Vrm @ 120Hz
Dissipation Factor
≤ 10% for ≥ 50V DC rating≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
Contact Factory for DF by PN
Insulation Resistance
100,000MΩ or 1000MΩ - µF,
whichever is less
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Dielectric Strength No breakdown or visual defects
Charge device with 250% of rated voltage for 1-5 seconds, w/
charge and discharge current limited to 50 mA (max)
Note: Charge device with 150% of rated voltage for 500V devices.
Resistance to
Flexure
Stresses
Appearance No defects
Deection: 2mm
Test Time: 30 seconds
Capacitance
Variation
≤ ±12%
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
≥ Initial Value x 0.3
Solderability
≥ 95% of each terminal should be covered with
fresh solder
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Resistance to
Solder Heat
Appearance No defects, <25% leaching of either end terminal
Dip device in eutectic solder at 260ºC for 60 seconds. Store at
room temperature for 24 ± 2hours before measuring electrical
properties.
Capacitance
Variation
≤ ±7.5%
Dissipation
Factor
Meets Initial Values (As Above)
Insulation
Resistance
Meets Initial Values (As Above)
Dielectric
Strength
Meets Initial Values (As Above)
Thermal Shock
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
≤ ±7.5% Step 2: Room Temp ≤ 3 minutes
Dissipation
Factor
Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes
Insulation
Resistance
Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes
Dielectric
Strength
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after 24 ± 2 hours at room
temperature
Load Life
Appearance No visual defects Pre-treatment: After mounting, perform heat treatment 150+0/-
10C for 2 hour, then stabilise for 24+/-2 hour at room temp,
then measure.
Charge device with ≥ rated voltage in test chamber set at
125ºC ± 2ºC for 1000 hours (+48, -0).
Pre-treatment: After remove from test chamber, perform heat
treatment 150+0/-10C for 2 hour, then stabilise for 24+/-2 hour
at room temp, then measure.
Contact KYOCERA AVX for datasheet of specic parts.
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
≤ Initial Value x 2.0 (See Above)
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
Load
Humidity
Appearance No visual defects
Pre-treatment: After mounting, perform heat treatment 150+0/-
10C for 2 hour, then stabilise for 24+/-2 hour at room temp,
then measure.
Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative
humidity for 1000 hours (+48, -0) with rated voltage applied.
Pre-treatment: After remove from test chamber, perform heat
treatment 150+0/-10C for 2 hour, then stabilise for 24+/-2 hour
at room temp, then measure.
Capacitance
Variation
≤ ±12.5%
Dissipation
Factor
≤ Initial Value x 2.0 (See Above)
Insulation
Resistance
≥ Initial Value x 0.3 (See Above)
Dielectric
Strength
Meets Initial Values (As Above)
073021
–
surface mount ceramic capacitor products
–
The Important Information/Disclaimer is incorporated in the catalog where these specications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.