C
B
E
SWITCHING CHARACTERISTICS (at Tamb=25 °C unless otherwise stated)
PARAMETER SYMBOL FMMT3905 FMMT3906 UNIT CONDITIONS
MIN MAX MIN MAX
Delay Time t
d
35 35 ns V
CC
=-3V, V
BE(off)
=-0.5V
I
C
=-10mA, I
B1
=-1mA
(See Fig.1)
Rise Time t
r
35 35 ns
Storage Time t
s
200 225 ns V
CC
=-3V, I
C
=-10mA
I
B1
=-I
B2
=-1mA
(See Fig.2)
Fall Time t
f
60 75 ns
FMMT3905
FMMT3906
SOT23 PNP SILICON PLANAR
SWITCHING TRANSISTORS
ISSUE 4 – MARCH 2000
PARTMARKING DETAILS - FMMT3905 - 2W
FMMT3906 - 2A
COMPLEMENTARY TYPES - FMMT3905 - FMMT3903
FMMT3906 - FMMT3904
ABSOLUTE MAXIMUM RATINGS.
PARAMETER SYMBOL VALUE UNIT
Collector-Base Voltage V
CBO
-40 V
CollectorEmitter Voltage V
CEO
-40 V
Emitter-Base Voltage V
EBO
-5 V
Continuous Collector Current I
C
-200 mA
Power Dissipation at T
amb
=25°C P
tot
330 mW
Operating and Storage Temperature Range T
j
:T
stg
-55 to +150 °C
ELECTRICAL CHARACTERISTICS (at T
amb
= 25°C unless otherwise stated).
PARAMETER SYMBOL FMMT3905 FMMT3906. UNIT CONDITIONS.
MIN MAX MIN MAX
BreakdownVoltages V
(BR)CBO
-40 -40 V
I
C
=-10µA, I
E
=0
V
(BR)CEO
-40 -40 V I
C
=-1mA, I
B
=0*
V
(BR)EBO
-5 -5 V
I
E
=-10µA, I
C
=0
Cut-Off Currents I
CEX
-50 -50 nA V
CE
=-30V, V
BE(off)
=-3V
I
BEX
-50 -50 nA V
CE
=-30V, V
EB(off)
=-3V
Static Forward
Current
Transfer Ratio
h
FE
30
40
50
30
15
150
60
80
100
60
30
300
I
C
=-0.1mA, V
CE
=-1V*
I
C
=-1mA, V
CE
=-1V*
I
C
=-10mA, V
CE
=-1V*
I
C
=-50mA, V
CE
=-1V*
I
C
=-100mA, V
CE
=-1V*
Saturation
Voltages
V
CE(sat)
-0.25
-0.4
0.25
0.4
V
V
I
C
=-10mA, I
B
=-1mA*
I
C
=-50mA, I
B
=-5mA*
V
BE(sat)
-0.65 -0.85
-0.95
-0.65 -0.85
-0.95
V
V
I
C
=-10mA, I
B
=-1mA*
I
C
=-50mA, I
B
=-5mA*
Transition
Frequency
f
T
200 250 MHz I
C
=-10mA, V
CE
=-20V
f=100MHz
Output Capacitance C
obo
4.5 4.5 pF V
CB
=-5V, I
E
=0, f=100KHz
Input Capacitance C
ibo
10 10 pF V
BE
=0.5V, I
C
=0, f=100KHz
Noise Figure N 5 4 dB I
C
=-200mA, V
CE
=-5V
Rg=2k
Ω, f=30Hz to 15kHz
at -3dB points
*Measured under pulsed conditions. Pulse width=200
µs. Duty cycle =1%
FMMT3905
FMMT3906
Delay and Rise Time
Equivalent Test Circuit
Storage and Fall Time
Equivalent Test Circuit
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