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BD5356FVE

BD5356FVE首页预览图
型号: BD5356FVE
PDF文件:
  • BD5356FVE PDF文件
  • BD5356FVE PDF在线浏览
功能描述: Free Delay Time Setting CMOS Voltage Detector IC Series
PDF文件大小: 308.66 Kbytes
PDF页数: 共12页
制造商: ROHM[Rohm]
制造商LOGO: ROHM[Rohm] LOGO
制造商网址: http://www.rohm.com
捡单宝BD5356FVE
PDF页面索引
120%
www.rohm.com © 2011 ROHM Co., Ltd. All rights reserved.
TSZ02201-0R7R0G300040-1-2
TSZ22111
15
001
10/10
19.DEC.2011 Rev.002
BD52xx series BD53xx series
Datasheet
Operational Notes
1 . Absolute maximum range
Absolute Maximum Ratings are those values beyond which the life of a device may be destroyed. We cannot be defined the
failure mode, such as short mode or open mode. Therefore a physical security countermeasure, like fuse, is to be given
when a specific mode to be beyond absolute maximum ratings is considered.
2 . GND potential
GND terminal should be a lowest voltage potential every state.
Please make sure all pins, which are over ground even if, include transient feature.
3 . Electrical Characteristics
Be sure to check the electrical characteristics that are one the tentative specification will be changed by temperature,
supply voltage, and external circuit.
4 . Bypass Capacitor for Noise Rejection
Please put into the capacitor of 1µF or more between V
DD
pin and GND, and the capacitor of about 1000pF between V
OUT
pin
and GND, to reject noise. If extremely big capacitor is used, transient response might be late. Please confirm sufficiently for
the point.
5 . Short Circuit between Terminal and Soldering
Don’t short-circuit between Output pin and V
DD
pin, Output pin and GND pin, or V
DD
pin and GND pin. When soldering the
IC on circuit board, please be unusually cautious about the orientation and the position of the IC. When the orientation is
mistaken the IC may be destroyed.
6 . Electromagnetic Field
Mal-function may happen when the device is used in the strong electromagnetic field.
7 . The V
DD
line inpedance might cause oscillation because of the detection current.
8. A V
DD
-GND capacitor (as close connection as possible) should be used in high VDD line impedance condition.
9 . Lower than the mininum input voltage makes the V
OUT high impedance, and it must be VDD in pull up (VDD) condition.
10. This IC has extremely high impedance terminals. Small leak current due to the uncleanness of PCB surface might cause
unexpected operations. Application values in these conditions should be selected carefully. If the leakage is assumed
between the V
OUT
terminal and the GND terminal, the pull-up resistor should be less than 1/10 of the assumed leak
resistance. If 10M leakage is assumed between the C
T
terminal and the GND terminal, 1M connection between the C
T
terminal and the V
DD terminal would be recommended. The value of RCT depends on the external resistor that is
connected to C
T
terminal, so please consider the delay time that is decided by ×R
CT
×C
CT
changes.
11. External parameters
The recommended parameter range for C
T is 100pF~0.1µF and RL is 50k~1M. There are many factors (board layout,
etc) that can affect characteristics. Please verify and confirm using practical applications.
12. Power on reset operation
Please note that the power on reset output varies with the V
DD
rise up time. Please verify the actual operation.
13. Precautions for board inspection
Connecting low-impedance capacitors to run inspections with the board may produce stress on the IC. Therefore, be
certain to use proper discharge procedure before each process of the test operation.
To prevent electrostatic accumulation and discharge in the assembly process, thoroughly ground yourself and any
equipment that could sustain ESD damage, and continue observing ESD-prevention procedures in all handing, transfer
and storage operations. Before attempting to connect components to the test setup, make certain that the power supply is
OFF. Likewise, be sure the power supply is OFF before removing any component connected to the test setup.
14. When the power supply, is turned on because of in certain cases, momentary Rash-current flow into the IC at the logic
unsettled, the couple capacitance, GND pattern of width and leading line must be considered.
Status of this document
The Japanese version of this document is formal specification. A customer may use this translation version only for a reference
to help reading the formal version.
If there are any differences in translation version of this document formal version takes priority.
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