1. General description
74AHC1G79-Q100 and 74AHCT1G79-Q100 are high-speed Si-gate CMOS devices.
They provide a single positive-edge triggered D-type flip-flop.
Information on the data input is transferred to the Q output on the LOW-to- HIGH transition
of the clock pulse. The D input must be stable one set-up time prior to the LOW-to-HIGH
clock transition for predictable operation.
The AHC device has CMOS input switching levels and supply voltage range 2 V to 5.5 V.
The AHCT device has TTL input switching levels and supply voltage range 4.5 V to 5.5 V.
This product has been qualified to the Automotive Electronics Council (AEC) standard
Q100 (Grade 1) and is suitable for use in automotive applications.
2. Features and benefits
Automotive product qualification in accordance with AEC-Q100 (Grade 1)
Specified from 40 C to +85 C and from 40 C to +125 C
Symmetrical output impedance
High noise immunity
Low power dissipation
Balanced propagation delays
SOT353-1 and SOT753 package options
ESD protection:
MIL-STD-883, method 3015 exceeds 2000 V
HBM JESD22-A114F exceeds 2000 V
MM JESD22-A115-A exce ed s 200 V (C = 200 pf, R = 0 )
74AHC1G79-Q100;
74AHCT1G79-Q100
Single D-type flip-flop; positive-edge trigger
Rev. 2 — 23 September 2014 Product data sheet