ASIC
PHY1
PHY2
FPGA
Oscillator
(156.25
MHz)
156.25 MHz
CDCLVD1204
LVDSBuffer
IN_SEL
CDCLVD1204
www.ti.com
SCAS898A –MAY 2010–REVISED JUNE 2010
2:4 Low Additive Jitter LVDS Buffer
Check for Samples: CDCLVD1204
1
FEATURES
DESCRIPTION
• 2:4 Differential Buffer
The CDCLVD1204 clock buffer distributes one of two
selectable clock inputs, (IN0, IN1), to 4 pairs of
• Low Additive Jitter: <300 fs RMS in 10-kHz to
differential LVDS clock outputs (OUT0, OUT3) with
20-MHz
minimum skew for clock distribution. The
• Low Output Skew of 20 ps (Max)
CDCLVD1204 can accept two clock sources into an
• Universal Inputs Accept LVDS, LVPECL, and
input multiplexer. The inputs can either be LVDS,
LVCMOS
LVPECL, or LVCMOS.
• Selectable Clock Inputs through Control Pin
The CDCLVD1204 is specifically designed for driving
• 4 LVDS Outputs, ANSI EAI/TIA-644A Standard
50 Ω transmission lines. In case of driving the inputs
in single ended mode, the appropriate bias voltage
Compatible
(V
AC_REF
) should be applied to the unused negative
• Clock Frequency up to 800 MHz
input pin.
• 2.375 V–2.625 V Device Power Supply
The IN_SEL pin selects the input which is routed to
• LVDS Reference Voltage, V
AC_REF
, Available for
the outputs. If this pin is left open it disables the
Capacitive Coupled Inputs
outputs (static). The part supports a fail safe function.
• Industrial Temperature Range: –40°C to 85°C
The device incorporates an input hysteresis which
prevents random oscillation of the outputs in the
• Packaged in 3 mm × 3 mm 16-Pin QFN (RGT)
absence of an input signal.
• ESD Protection Exceeds 3 kV HBM, 1 kV CDM
The device operates in 2.5V supply environment and
is characterized from –40°C to 85°C (ambient
APPLICATIONS
temperature). The CDCLVD1204 is packaged in
• Telecommunications/Networking
small 16-pin, 3-mm × 3-mm QFN package.
• Medical Imaging
• Test and Measurement Equipment
• Wireless Communications
• General Purpose Clocking
Figure 1. Application Example
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2010, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
